smart warnings build05

[zowoq]

• /dev/nvme0: failed
• /dev/nvme1: failed

$ sudo smartctl -a /dev/nvme0
smartctl 7.4 2023-08-01 r5530 [aarch64-linux-6.12.8] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Number:                       SAMSUNG MZQL2960HCJR-00A07
Serial Number:                      S64FNE0R705062
Firmware Version:                   GDC5802Q
PCI Vendor/Subsystem ID:            0x144d
IEEE OUI Identifier:                0x002538
Total NVM Capacity:                 960,197,124,096 [960 GB]
Unallocated NVM Capacity:           0
Controller ID:                      6
NVMe Version:                       1.4
Number of Namespaces:               32
Local Time is:                      Mon Jan  6 02:00:03 2025 UTC
Firmware Updates (0x17):            3 Slots, Slot 1 R/O, no Reset required
Optional Admin Commands (0x005f):   Security Format Frmw_DL NS_Mngmt Self_Test MI_Snd/Rec
Optional NVM Commands (0x005f):     Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp
Log Page Attributes (0x0e):         Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg
Maximum Data Transfer Size:         512 Pages
Warning  Comp. Temp. Threshold:     80 Celsius
Critical Comp. Temp. Threshold:     83 Celsius

Supported Power States
St Op     Max   Active     Idle   RL RT WL WT  Ent_Lat  Ex_Lat
 0 +    25.00W   14.00W       -    0  0  0  0       70      70
 1 +     8.00W    8.00W       -    1  1  1  1       70      70

=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded

SMART/Health Information (NVMe Log 0x02)
Critical Warning:                   0x04
Temperature:                        37 Celsius
Available Spare:                    100%
Available Spare Threshold:          10%
Percentage Used:                    162%
Data Units Read:                    99,104,725 [50.7 TB]
Data Units Written:                 8,772,715,905 [4.49 PB]
Host Read Commands:                 1,660,627,155
Host Write Commands:                26,755,837,383
Controller Busy Time:               157,851
Power Cycles:                       75
Power On Hours:                     18,552
Unsafe Shutdowns:                   43
Media and Data Integrity Errors:    0
Error Information Log Entries:      2
Warning  Comp. Temperature Time:    0
Critical Comp. Temperature Time:    0
Temperature Sensor 1:               37 Celsius
Temperature Sensor 2:               46 Celsius

Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged

Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged

$ sudo smartctl -a /dev/nvme1
smartctl 7.4 2023-08-01 r5530 [aarch64-linux-6.12.8] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Number:                       SAMSUNG MZQL2960HCJR-00A07
Serial Number:                      S64FNE0R705075
Firmware Version:                   GDC5802Q
PCI Vendor/Subsystem ID:            0x144d
IEEE OUI Identifier:                0x002538
Total NVM Capacity:                 960,197,124,096 [960 GB]
Unallocated NVM Capacity:           0
Controller ID:                      6
NVMe Version:                       1.4
Number of Namespaces:               32
Local Time is:                      Mon Jan  6 02:01:10 2025 UTC
Firmware Updates (0x17):            3 Slots, Slot 1 R/O, no Reset required
Optional Admin Commands (0x005f):   Security Format Frmw_DL NS_Mngmt Self_Test MI_Snd/Rec
Optional NVM Commands (0x005f):     Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp
Log Page Attributes (0x0e):         Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg
Maximum Data Transfer Size:         512 Pages
Warning  Comp. Temp. Threshold:     80 Celsius
Critical Comp. Temp. Threshold:     83 Celsius

Supported Power States
St Op     Max   Active     Idle   RL RT WL WT  Ent_Lat  Ex_Lat
 0 +    25.00W   14.00W       -    0  0  0  0       70      70
 1 +     8.00W    8.00W       -    1  1  1  1       70      70

=== START OF SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
- NVM subsystem reliability has been degraded

SMART/Health Information (NVMe Log 0x02)
Critical Warning:                   0x04
Temperature:                        38 Celsius
Available Spare:                    100%
Available Spare Threshold:          10%
Percentage Used:                    162%
Data Units Read:                    93,544,486 [47.8 TB]
Data Units Written:                 8,777,740,538 [4.49 PB]
Host Read Commands:                 1,651,517,678
Host Write Commands:                26,771,573,419
Controller Busy Time:               158,789
Power Cycles:                       75
Power On Hours:                     18,552
Unsafe Shutdowns:                   42
Media and Data Integrity Errors:    0
Error Information Log Entries:      2
Warning  Comp. Temperature Time:    0
Critical Comp. Temperature Time:    0
Temperature Sensor 1:               38 Celsius
Temperature Sensor 2:               47 Celsius

Error Information (NVMe Log 0x01, 16 of 64 entries)
No Errors Logged

Self-test Log (NVMe Log 0x06)
Self-test status: No self-test in progress
No Self-tests Logged