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Level testing formatting and updates.#66

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brandonboesch wants to merge 21 commits intoARMmbed:level-testingARMmbed/ci-test-shield:level-testingfrom brandonboesch:level-testingbrandonboesch/ci-test-shield:level-testingCopy head branch name to clipboard

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Commits on Jul 14, 2017

• Removed print statement from Level1/AnalogIn that I added earlier for debug purposes

  

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• Fixed bug in BusInOut where it was calling level2 framework instead of level1. Formatted code

  

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Commits on Jul 17, 2017

• added ifdef guards to TestFramework.cpp, so that it can compile with boards that don't have all the PinMaps defined

  

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• changed printf to use hex instead if decimal when printing pin names

  

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• Added #ifdef check in map_pins() so that it no longer adds ADC internal channels on STM boards, as they cause timeout errors when constructed

  

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• Debug printf calls now report as hex instead of decimal for pin names on level1 tests.

  

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• Fixed typo in DigitalIO.cpp. Turned of Debug mode in mbed_app.json

  

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Commits on Aug 4, 2017

• Formatted Level0 code per Martin Kojtal's request.

  

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Commits on Aug 7, 2017

• Formatted Level1 code per Martin Kojtal's requested format.

  

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• Formatted TestFramework code per Martin Kojtal's requested format.

  

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• Modified Level1/I2C. Removed assert testing on write and then read of null string, since the test was not really determining which of the two functions was failing individually. The remaining test …

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Commits on Aug 11, 2017

• Updated assert checking for SPI and I2C Level1 tests, ensuring that Arduino pins are connected to shield properly. Removed unused code from Level1 DIO test.

  

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Commits on Aug 14, 2017

• Formatted Level2 tests to match mbed style guide.

  

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• Finished testing and updating Level2 AnalogIn.

  

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Commits on Aug 16, 2017

• Updated level1-spi test so that it no longer checks the cs pin in the CS pinmap, but rather the DigitalIO pinmap, per response of issue that I raised here: ARMmbed/mbed-os#4894

  

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• Updated level2-spi and level3-spi tests so that they no longer checks the cs pin in the CS pinmap, but rather the DigitalIO pinmap, per response of issue that I raised here: ARMmbed/mbed-os#4894

  

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Commits on Aug 17, 2017

• Level2-DIO test was only running 6 tests on the K64F instead of the intended 8 (one for each DIO pin that has a pin pair). Debugged issue and found that 2 of the DIO pins mapped to the Arduino Head…

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• Finished testing level2/i2c. The logic used to test if write and read occured was not accurate, and not really necessary for the test to begin with, so was removed.

  

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• Removed the UART pins from DIO since having DEVICE_SERIAL defined, does not guarantee that UART_RTS and UART_CTS pins are defined in PeripheralPins.c, which will cause compile time errors if they a…

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• Finished testing level2-pwm

  

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Commits on Aug 18, 2017

• Finished testing level2/Spi. Should be finished testing all of level 2 now.

  

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